Prasad, K. ; Yuan, X.L. ; Tan, C.M. ; Zhang, D.H. ; Li, C. Y. ; Wang, S.R. ; Yuan, S.Y.J. ; Xie, J.L. ; Gui, D. ; Foo, P.D.
Pub. info.:
Silicon materials - processing characterization and reliability : symposium held April 1-5, 2002, San Francisco, California, U.S.A.. pp.395-400, 2002. Warrendale. Materials Research Society
Holography, diffractive optics, and applications : 15-17 October 2002, Shanghai, China. pp.228-231, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering