Color science and imaging technologies : 16-17 October, 2002, Shanghai, China. pp.159-162, 2002. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Visual communications and image processing 2002 : 21-23 January 2002, San Jose, USA. pp.221-229, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Visual communications and image processing 2002 : 21-23 January 2002, San Jose, USA. pp.251-259, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Hwang, Y.-S. ; Jung, J.-C. ; Park, K.-D. ; Lee, S.-K. ; Kim, J.-S. ; Kong, K.-K. ; Shin, K.-S. ; Ding, S.-J. ; Xiang, Z. ; Neisser, M.
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Advances in Resist Technology and Processing XIX. Part Two pp.1119-1125, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Wu, H. ; Xiang, Z. ; Gonzalez, E. ; Shan, J. ; Ding, S. ; Kang, W.-B. ; Hishida, A.
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Advances in Resist Technology and Processing XIX. Part Two pp.1112-1118, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Xiang, Z. ; Shan, J. ; Gonzalez, E. ; Wu, H. ; Ding, S. ; Neisser, M. ; Ho, B.-C. ; Chen, H.
Pub. info.:
Advances in Resist Technology and Processing XIX. Part Two pp.1102-1111, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering