1.

Conference Proceedings

Conference Proceedings
Wu,Q. ; Xiong,Z. ; Castleman,K.R.
Pub. info.: Applications of digital image processing XXIV : 31 July - 3 August 2001, San Diego, USA.  pp.334-341,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4472
2.

Conference Proceedings

Conference Proceedings
Liu,Z. ; Xiong,Z. ; Wu,Q. ; Wang,Y.-P. ; Castleman,K.R.
Pub. info.: Applications of digital image processing XXIV : 31 July - 3 August 2001, San Diego, USA.  pp.349-360,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4472
3.

Conference Proceedings

Conference Proceedings
Wu,Q. ; Liu,X. ; Kim,B.
Pub. info.: MEMS design, fabrication, characterization, and packaging : 30 May-1 June 2001, Edinburgh, UK.  pp.267-274,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4407
4.

Conference Proceedings

Conference Proceedings
Killeen,T.L. ; Skinner,W.R. ; Johnson,R.M. ; Edmonson,C.J. ; Wu,Q. ; Niciejewski,R.J. ; Grassl,H.J. ; Gell,D.A. ; Hansen,P.E. ; Harvey,J.D. ; Kafkalidis,J.F.
Pub. info.: Optical spectroscopic techniques and instrumentation for atmospheric and space research III :19-21 July 1999, Denver, Colorado.  pp.289-301,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3756
5.

Conference Proceedings

Conference Proceedings
Ren,D. ; Jiang,X. ; Wu,Q. ; YOU,Z.
Pub. info.: Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China.  pp.15-18,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4221
6.

Conference Proceedings

Conference Proceedings
Zhang,G. ; Xu,J. ; Sun,Q. ; Liu,S. ; Wu,Q.
Pub. info.: Electro-Optic and second harmonic generation materials, devices, and applications.  pp.171-173,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2897
7.

Conference Proceedings

Conference Proceedings
Hodgkinson,I.J. ; Wu,Q. ; Thorn,K.E.
Pub. info.: Complex mebiums : 30 July-1 August 2000, San Diego, USA.  pp.330-337,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4097
8.

Conference Proceedings

Conference Proceedings
Lu,B. ; Dentinger,P.M. ; Taylor,J.W. ; Feke,G.D. ; Hessman,D. ; Wu,Q. ; Grober,R.D.
Pub. info.: Emerging lithographic technologies III : 15-17 March 1999, Santa Clara, California.  Part2  pp.466-472,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3676
9.

Conference Proceedings

Conference Proceedings
Yang,Y. ; Huang,J. ; Wu,Q. ; Sun,G. ; Fei,H. ; Wei,Z. ; Shen,J.
Pub. info.: Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan.  pp.384-388,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3740
10.

Conference Proceedings

Conference Proceedings
Wu,Q. ; Lu,Z. ; Tao,J. ; Xin,H. ; Gou,Z.
Pub. info.: Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China.  pp.430-436,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4231