1.

Conference Proceedings
Conference Proceedings
1. Intercomparison of airborne N20 measurements using tunable diode laser absorption spectroscopy and in-situ gas chromatography
Hoor,P.M. ; Fischer,H. ; Wong,S. ; Engel,A. ; Wetter,T.
Pub. info.: Application of tunable diode and other infrared sources for atmospheric studies and industrial processing monitoring II : 19-20 July 1999, Denver, Colorado.  pp.109-115,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3758
2.

Conference Proceedings
Conference Proceedings
2. Limited-angle tomography using artificial neural network
Yau,S. ; Wong,S.
Pub. info.: Applications of artificial neural networks in image processing : 1-2 February 1996, San Jose, California.  pp.170-181,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2664
3.

Conference Proceedings
Conference Proceedings
3. Spectroellipsometric study of optical and electrical properties of buried CoSi2 layers in silicon produced by MEYVA implantation
Guo,W. ; Wong,S. ; Zhu,Z.
Pub. info.: Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China.  pp.561-570,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3558
4.

Conference Proceedings
Conference Proceedings
4. Spectroellipsometric study of SiC/Si heterostructures produced by MEVVA implantation
Guo,W. ; Zhu,Z. ; Wong,S.
Pub. info.: Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China.  pp.578-586,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3558
5.

Conference Proceedings
Conference Proceedings
5. Spectroellipsometric study of diamondlike carbon films
Guo,W. ; Wong,S. ; Zhu,Z.
Pub. info.: Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China.  pp.571-577,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3558
6.

Technical Paper
Technical Paper
6. The Design, Fabrication, and Testing of Simulated Ice Shapes for the S-92A Helicopter
Flemming,R. ; Papadakis,M. ; Murty,H. ; Wong,S.
Pub. info.: AIAA meeting papers on disc.  2004.  [Reston, Va.].  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : Aerospace Sciences Meeting and Exhibit
Ser. no.: 42nd
7.

Conference Proceedings
Conference Proceedings
7. Improvement on 3D medical image reconstruction using comatching correspondence finding method
Wong,S. ; Chan,K.
Pub. info.: Medical Imaging 1997: Image Display.  pp.571-581,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3031
8.

Conference Proceedings
Conference Proceedings
8. Segmentation of magnetic resonance image using fractal dimension
Yau,J.K.K. ; Wong,S. ; Chan,K.L.
Pub. info.: Medical Imaging 1997: Image Processing.  Part1  pp.120-130,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3034
9.

Conference Proceedings
Conference Proceedings
9. Optimization of surface-micromachined patch antenna
Wong,S. ; Ooi,B.L. ; Kooi,P.S. ; Ng,T.H. ; Liu,A.Q.
Pub. info.: Micromachined Devices and Components VI.  pp.204-213,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4176