1.

Conference Proceedings
Conference Proceedings
1. Interaction between Cu and Sn in the Early Stages of Ageing of Al-1.7at.%Cu-0.01at.%Sn
Bourgeois, L. ; Wong, T. ; Xiong, X.Y. ; Nie, J.F. ; Muddle, B.C.
Pub. info.: Aluminium alloys 2006 : research through innovation and technology : proceedings of the 10th International Conference on Aluminium Alloys, Vancouver, Canada, July 9th-13th, 2006.  pp.495-500,  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 519-521
2.

Conference Proceedings
Conference Proceedings
2. A DSP-based controller for a linear actuator system with sub-angstrom resolution and 15-millimeter travel range [5877-16]
Smolyanitskiy, A. ; Shu, D. ; Wong, T.
Pub. info.: Optomechanics 2005 : 3-4 August 2005, San Diego, California, USA.  pp.58770G-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5877
3.

Conference Proceedings
Conference Proceedings
3. Multilevel amplitude-modulation system for optical data storage (Invited Paper)
Zhou, T.R. ; Tan, C. ; Leis, C. ; Harvey, I ; Lewis, G. ; Wong, T. ; O'Neill, M.P.
Pub. info.: Advanced optical storage technology : 15-18 October, 2002, Shanghai, China.  pp.7-20,  2002.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4930
4.

Conference Proceedings
Conference Proceedings
4. Optimal instrument control strategy for an actuator system with 1-angstrom closed-loop positioning resolution
Han, Y. ; Wong, T. ; Shu, D.
Pub. info.: Optomechanics 2003 : 7-8 August 2003, San Diego, California, USA.  pp.147-155,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5176
5.

Conference Proceedings
Conference Proceedings
5. Scalar measurements in a flickering flame using high-speed rainbow schlleren deflectometry
Wong, T. ; Agrawal, A. K.
Pub. info.: 26th International Congress on High-Speed Photography and Photonics : 20-24 September 2004, Alexandria, Virginia, USA.  pp.347-357,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5580
6.

Technical Paper
Technical Paper
6. An Improved Radiation Budget Data Set Using Merged CERES and GEO Data
Doelling, D. ; Keyes, D. ; Young, D. ; Wielicki, B. ; Wong, T.
Pub. info.: AIAA meeting papers on disc.  2004.  [Reston, Va.].  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA Space Conference and Exposition
Ser. no.: 2004
7.

Technical Paper
Technical Paper
7. TRW LCPE 650 KLBf LOX/LH2 Test Results
Gavitt, K. ; Mueller, T. ; Wong, T. ; Thom, H. ; Murphy, C. ; Weede, J.
Pub. info.: AIAA paper.  pp.1-8,  2000.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA/ASME/SAE/ASEE Joint Propulsion Conference and Exhibit
Ser. no.: 2000
8.

Conference Proceedings
Conference Proceedings
8. Novel combined low-coherence interferometry spectrally resolved reflectometry compatible with high-resolution Raman spectroscopy for nondestructive characterization of MEMS・ structures [6111-26]
Walecki, W. J. ; Azfar, T. ; Pravdivstev, A. ; SantosII, M. ; Wong, T. ; Feng, A. ; Koo, A.
Pub. info.: Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V.  pp.61110M-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6111
9.

Conference Proceedings
Conference Proceedings
9. Low-coherence interferometric absolute distance gauge for study of MEMS structures
Walecki, W.J. ; Lai, K. ; Pravdivtsev, A. ; Souchkov, V. ; Van, P. ; Azfar, T. ; Wong, T. ; Lau, S.H. ; Koo, A.
Pub. info.: Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV.  pp.182-188,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5716