1.

Conference Proceedings
Conference Proceedings
1. Optimization of SiGe Graded Buffer Defectivity and Throughput by Means of High Growth Temperature and Pre-Threaded Substrates
Ertmann, Matthew ; Currie, Matthew T. ; Woicik, Joseph C. ; Black, David
Pub. info.: Progress in semiconductor materials V--novel materials and electronic and optoelectronic applications : symposium held November 28-December 1, 2005, Boston, Massachusetts, U.S.A..  pp.573-578,  2006.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 891
2.

Conference Proceedings
Conference Proceedings
2. XAFS as a Direct Local Structural Probe in Revealing the Effects of C Presence in B Diffusion in SiGe Layers
Sahiner, M.Alper ; Ansari, Parviz ; Carroll, Malcolm S. ; Magee, Charles W. ; Novak, Steven W. ; Woicik, Joseph C.
Pub. info.: Silicon front-end junction formation : physics and technology : symposium held April 13-15, 2004, San Francisco, California, U.S.A..  pp.481-488,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 810
3.

Conference Proceedings
Conference Proceedings
3. The Role Of Ge in Cluster Formation in B and BF2 Implanted Si Wafers After Ge Pre-Amorphization
Sahiner, M. Alper ; Magee, Charles W. ; Downey, Daniel F. ; Arevalo, Edwin ; Woicik, Joseph C.
Pub. info.: Radiation effects and ion-beam processing of materials : symposium held December 1-5, 2003, Boston, Massachusetts, U.S.A..  pp.301-308,  2004.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 792