Targets and backgrounds IX: Characterization and representation : 21-22 April 2003, Oriando, Florida, USA. pp.97-101, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Bassous, E. ; Freeman, M. ; Halbout, J.-M. ; Iyer, S.S. ; Kesan, V.P. ; Munguia, P. ; Pesarcik, S.F. ; Williams, B.L.
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