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Infrared detector materials and devices : 4-5 August 2004, Denver, Colorado, USA. pp.15-26, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Aqariden, Fikri ; Wijewarnasuriya, P. S. ; Rujirawat, S. ; Sivananthan, S.
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Infrared applications of semiconductors - materials, processing, and devices : symposium held December 2-5, 1996, Boston, Massachusetts, U.S.A. pp.251-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society
Rujirawat, S. ; Wijewarnasuriya, P. S. ; Chen, Y. P. ; Aqariden, F. ; Sivananthan, S.
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Infrared applications of semiconductors - materials, processing, and devices : symposium held December 2-5, 1996, Boston, Massachusetts, U.S.A. pp.281-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society
Masterjohn, S. A. ; D'Souza, A. I. ; Dawson, L. C. ; Dolan, P. N. ; Jefferson, G. ; Stapelbroek, M. G. ; Willis, R. W. ; Wijewarnasuriya, P. S. ; Boehmer, E. ; Ehlert, J. C. ; Andrews, J. E.
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Multispectral and hyperspectral remote sensing instruments and applications II : 9-11 November 2004, Honolulu, Hawaii, USA. pp.343-352, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Lee, T. -S. ; Zhao, J. ; Chang, Y. ; Ashokan, R. ; Sivananthan, S. ; Boieriu, P. ; Chen, Y. ; Brill, G. ; Wijewarnasuriya, P. S. ; Dhar, N. K.
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Infrared detector materials and devices : 4-5 August 2004, Denver, Colorado, USA. pp.113-122, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
D'Souza, A. I. ; Stapelbroek, M. G. ; Dolan, P. N. ; Wijewarnasuriya, P. S. ; Boehmer, E. ; Smith, D. S. ; Ehlert, J. C. ; Andrews, J. E.
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Infrared technology and applications XXXI : 28 March-1 April 2005, Orlando, Florida, USA. pp.199-210, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering