1.

Conference Proceedings
Conference Proceedings
1. GRAZINGEMISSION X-RAY FLUORESCENCE SPECTROMETRY: A NOVEL TOOL FOR SURFACE CONTAMINATION ANALYSIS AND THIN FILM METROLOGY
deBokx, P.K. ; Kidd, S.J. ; Wiener, G. ; Urbach, H.P. ; De Gendt, S. ; Mertens, P.W. ; Heyns, M.M.
Pub. info.: Silicon materials science and technology : proceedings of the Eighth International Symposium on Silicon Materials Science and Technology.  pp.1511-1523,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-1(2)
2.

Conference Proceedings
Conference Proceedings
2. Silicon Surface Metal Contamination Measurements Using Grazing-Emission XRF Spectrometry
Gendt, S. de ; Kenis, K. ; Baeyens, M. ; Mertens, P. W. ; Heyns, M. M. ; Wiener, G. ; Kidd, S. J. ; Knotter, D. M. ; Bokx, P. K. de
Pub. info.: Science and technology of semiconductor surface preparation : symposium held April 1-3, 1997, San Francisco, California, U.S.A..  pp.397-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 477
3.

Conference Proceedings
Conference Proceedings
3. A New Technique for Depth Profiling on a Nanometer Scale
Schwenke, H. ; Knoth, J. ; Gunther, R. ; Wiener, G. ; Bormann, R.
Pub. info.: Surface/interface and stress effects in electronic material nanostructures : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A..  pp.407-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 405
4.

Technical Paper
Technical Paper
4. Description and Verification of the NCAR Integrated Turbulence Forecasting Algorithm (ITFA)
Sharman, R. ; Wiener, G. ; Brown, B.
Pub. info.: AIAA paper.  pp.1-8,  2000.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : Aerospace Sciences Meeting and Exhibit
Ser. no.: 2000