1.

Conference Proceedings

Conference Proceedings
Kelemen, M.T. ; Rinner, F. ; Rogg, J. ; Wiedmann, N. ; Kiefer, R. ; Walther, M. ; Mikulla, M. ; Weimann, G.
Pub. info.: Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA.  pp.75-81,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4648
2.

Conference Proceedings

Conference Proceedings
Rinner, F. ; Rogg, J. ; Wiedmann, N. ; Konstanzer, H. ; Damman, M. ; Mikulla, M. ; Poprawe, R. ; Weimann, G.
Pub. info.: Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA.  pp.1-8,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4648