1.
Conference Proceedings
Hui,A. ; Blosiu,J.O. ; Wiberg,D.V.
Pub. info.:
Advances in resist technology and processing XV : 23-25 February 1998, Santa Clara, California . Part 2 pp.1304-1313, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3333
2.
Conference Proceedings
Yang,E.-H. ; Wiberg,D.V. ; Dekany,R.G.
Pub. info.:
Imaging Technology and Telescopes . pp.83-89, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4091
3.
Conference Proceedings
Brennen,R.A. ; Hecht,M.H. ; Wiberg,D.V. ; Manion,S.J. ; Bonivert,W.D. ; Hruby,J.M. ; Pister,K.S.J. ; Kruglick,E.
Pub. info.:
Microlithography and Metrology in Micromachining . pp.226-235, 1995. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2640
4.
Conference Proceedings
Brennen,R.A. ; Hecht,M.H. ; Wiberg,D.V. ; Manion,S.J. ; Bonivert,W.D. ; Hruby,J.M. ; Scholz,M.L. ; Stowe,T.D. ; Kenny,T.W. ; Jackson,K.H. ; Malek,C.Khan
Pub. info.:
Microlithography and Metrology in Micromachining . pp.214-225, 1995. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2640