1.

Conference Proceedings
Conference Proceedings
1. INFRARED MAPPING OF OXYGEN AND CORRELATION WITH ELECTRICAL MEASUREMENTS ON CZ GROWN WAFERS
Whitfield, J. ; Boyle, R.
Pub. info.: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.275-280,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 46
2.

Conference Proceedings
Conference Proceedings
2. DEEP LEVELS ASSOCIATED WITH OXYGEN PRECIPITATION IN CZ SILICON AND CORRELATION WITH MINORITY CARRIER LIFETIMES
Chan, S.S. ; Varker, C. J. ; Whitfield, J. ; Carpenter, R. W.
Pub. info.: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.281-286,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 46