1.

Conference Proceedings
Conference Proceedings
1. INFLUENCE OF THE SURFACE DEPLETION LAYER ON THE PHOTO-ETCHING RATE AT GROWTH STRIATIONS IN LEC GaAs
Frigeri, C. ; Weyher, J.L. ; Zanotti, L.
Pub. info.: Characterization of the structure and chemistry of defects in materials : symposium held November 28-December 3, 1988, Boston, Massachusetts, U.S.A..  pp.527-532,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 138
2.

Conference Proceedings
Conference Proceedings
2. Electrochemistry and Etching of Wide Bandgap, Chemically Resistant Semiconductors
Kelly, J.J. ; Macht, L. ; van Dorp, D.H. ; Kooljman, M.R. ; Weyher, J.L.
Pub. info.: State-of-the-art program on compound semiconductors (SOTAPOCS XLII) and processes at the compound-semiconductor/solution interface : proceedings of the international symposia.  pp.138-146,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-04
3.

Conference Proceedings
Conference Proceedings
3. High-power pulse-current-operated violet light emitting lasers grown on bulk GaN substrates
Perlin, P. ; Leszczynski, M. ; Prystawko, P. ; Czernetzki, R. ; Wisniewski, P. ; Weyher, J.L. ; Nowak, G. ; Borysiuk, J. ; Gorczyca, L. ; Swietlik, T. ; Franssen, G. ; Bering, A. ; Skierbiszewski, C. ; Grzegory, I. ; Suski, T. ; Porowski, S.
Pub. info.: Novel In-Plane Semiconductor Lasers III.  pp.288-296,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5365