1.

Conference Proceedings
Conference Proceedings
1. Wafer and reticle positioning system for the extreme ultraviolet lithography engineering test stand
Wronosky,J.B. ; Smith,T.G. ; Craig,M.J. ; Sturgis,B.R. ; Darnold,J.R. ; Werling,D.K. ; Kincy,M.A. ; Tichenor,D.A. ; Williams,M.E. ; Bischoff,P.M.
Pub. info.: Emerging lithographic technologies IV : 28 February-1 March 2000, Santa Clara, USA.  pp.829-839,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3997
2.

Conference Proceedings
Conference Proceedings
2. Use ｏｆ laser radar for small space object experiments
Hasson,V. ; Corbett,F. ; Groden,M. ; Hogenboom,D. ; Dryden,G. ; Pohle,R. ; Phlpps,C.R. ; Werling,D.K. ; Czyzak,S.R. ; Gonglewski,J. ; Campbell,J.W.
Pub. info.: Imaging Technology and Telescopes.  pp.363-374,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4091
3.

Conference Proceedings
Conference Proceedings
3. Photometric measurements of deep space satellites
Sanchez,D.J. ; Gregory,S.A. ; Werling,D.K. ; Payne,T.E. ; Kann,L. ; Finkner,L.G. ; Payne,D.M. ; Davis,C.K.
Pub. info.: Imaging Technology and Telescopes.  pp.164-182,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4091