1.

Conference Proceedings

Conference Proceedings
Kelemen, M.T. ; Rinner, F. ; Rogg, J. ; Wiedmann, N. ; Kiefer, R. ; Walther, M. ; Mikulla, M. ; Weimann, G.
Pub. info.: Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA.  pp.75-81,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4648
2.

Conference Proceedings

Conference Proceedings
Mikulla, M. ; Kelemen, M.T. ; Walther, M. ; Kiefer, R. ; Moritz, R. ; Weimann, G.
Pub. info.: APOC 2001: Asia-Pacific Optical and Wireless Communications : Optoelectronics, Materials, and Dvices for Communications : 13-15 November 2001, Beijing, Chaina.  pp.11-18,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4580
3.

Conference Proceedings

Conference Proceedings
Germann, R. ; Forchel, A. ; Horcher, G. ; Weimann, G.
Pub. info.: Processing and characterization of materials using ion beams : symposium held November 28-December 2, 1988, Boston, Massachusetts, U.S.A..  pp.749-754,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 128
4.

Conference Proceedings

Conference Proceedings
Rinner, F. ; Rogg, J. ; Wiedmann, N. ; Konstanzer, H. ; Damman, M. ; Mikulla, M. ; Poprawe, R. ; Weimann, G.
Pub. info.: Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA.  pp.1-8,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4648
5.

Conference Proceedings

Conference Proceedings
Walther, M. ; Fuchs, F. ; Schneider, H. ; Fleissner, J. ; Schmitz, J. ; Pletschen, W. ; Braunstein, J. ; Ziegler, J. ; Cabanski, W. ; Koidl, P. ; Weimann, G.
Pub. info.: Infrared technology and applications XXIV : 19-24 July 1998, San Diego, California.  Part 1  pp.348-358,  1998.  Bellingham, Wash., USA.  SPIE
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3436
6.

Conference Proceedings

Conference Proceedings
Sah, R.E. ; Mikulla, M. ; Schneider, H. ; Benkhelifa, F. ; Dammann, M. ; Quay, R. ; Fleisner, J. ; Walther, M. ; Weimann, G.
Pub. info.: State-of-the-art program on compound semiconductors (SOTAPOCS XLII) and processes at the compound-semiconductor/solution interface : proceedings of the international symposia.  pp.338-349,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-04
7.

Conference Proceedings

Conference Proceedings
Schneider, H. ; Maier, Th. ; Fleissner, J. ; Walther, M. ; Koidl, P. ; Weimann, G. ; Cabanski, W. ; Finck, M. ; Menger, P. ; Rode, W. ; Ziegler, J.
Pub. info.: Semiconductor photodetectors II : 25-26 January 2005, San Jose, California, USA.  pp.35-42,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5726
8.

Conference Proceedings

Conference Proceedings
Sah, R.E. ; Rinner, F. ; Keifer, R. ; Mikulla, M. ; Weimann, G.
Pub. info.: Plasma processing XIV : proceedings of the international symposium.  pp.35-42,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-17
9.

Conference Proceedings

Conference Proceedings
Kallenbach, S. ; Kelemen, M.T. ; Aidam, R. ; Losch, R. ; Kaufel, G. ; Mikulla, M. ; Weimann, G.
Pub. info.: Novel In-Plane Semiconductor Lasers IV.  pp.406-415,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5738
10.

Conference Proceedings

Conference Proceedings
Scholz, C. ; Boucke, K. ; Poprawe, R. ; Keleman, M. T. ; Weber, J. ; Mikulla, M. ; Weimann, G.
Pub. info.: High-Power Diode Laser Technology and Applications IV.  pp.61040G-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6104