1.

Conference Proceedings

Conference Proceedings
Wuyts, K. ; Watte, J. ; Silverans, R. E. ; M-nder, H. ; Berger. M. G. ; L-th, H. ; Van Hove M, ; Van Rossum,. M.
Pub. info.: Advanced metallization and processing for semiconductor devices and circuits--II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A..  pp.355-358,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 260
2.

Conference Proceedings

Conference Proceedings
Watte, J. ; Silverans, R. E. ; Munder, H. ; Wuyts, K.
Pub. info.: Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A..  pp.659-664,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 262
3.

Conference Proceedings

Conference Proceedings
Watte, J. ; Silverans, R. E. ; Munder, H. ; Palmstom, C. J. ; Florez, L. T. ; Hove, M. Van ; Borghs, G. ; Wuyts, K.
Pub. info.: Advanced metallization for devices and circuits--science, technology, and manufacturability : symposium held April 4-8, 1994, San Francisco, California, U.S.A..  pp.331-,  1994.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 337
4.

Conference Proceedings

Conference Proceedings
Lin, X. W. ; Watte, J. ; Wuyts, K. ; Swider, W. ; Silverans, R. E. ; Liliental-Weber, Z. ; Washburn, J.
Pub. info.: Advanced metallization for devices and circuits--science, technology, and manufacturability : symposium held April 4-8, 1994, San Francisco, California, U.S.A..  pp.295-,  1994.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 337
5.

Conference Proceedings

Conference Proceedings
Krajewski, R.G. ; Volckaerts, B. ; Ottevaere, H. ; Vynck, P. ; Watte, J. ; Daems, D. ; Kujawinska, M. ; Hermanne, A. ; Thienpont, H.
Pub. info.: Microsystems Engineering: Metrology and Inspection III.  pp.87-97,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5145
6.

Conference Proceedings

Conference Proceedings
Watte, J. ; Leeman, S. ; Swinnen, L. ; Van Goidsenhoven, D. ; Daems, D.
Pub. info.: Micro-Optics: Fabrication, Packaging, and Integration.  pp.102-110,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5454