1.

Conference Proceedings
Conference Proceedings
1. Modal Testing for Microstructures,#60
Chou,Y.F. ; Wang,L.C.
Pub. info.: Proceedings of the 17th International Modal Analysis Conference February 8-11, 1999 Hyatt Orlando Hotel Kissimmee, Florida.  Part2  pp.1783-1788,  1999.  Bethel, CT.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3727
2.

Conference Proceedings
Conference Proceedings
2. Scanning array lens lithography for large-area applications
Wang,L.C. ; Markle,D.A. ; Ellis,R.J.
Pub. info.: Emerging lithographic technologies : 10-11 March 1997, Santa Clara, California.  pp.271-286,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3048
3.

Conference Proceedings
Conference Proceedings
3. Possible Approach to the Phase Problem in Quasicrystals
Li,F.H. ; Wang,L.C. ; Fan,H.F.
Pub. info.: Quasicrystals : proceedings of the International Workshop on Quasicrystals held in Beijing during August 30 - September 5, 1987.  pp.397-408,  1987.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 22-24
4.

Conference Proceedings
Conference Proceedings
4. Properties of ultrathin gate oxides grown in N20-based oxidation ambients by rapid thermal processing
Jia,Y.B. ; Pan,O.G. ; Wang,L.C. ; Lo,P. ; Lee,S.K. ; Choi,J.Y. ; Shih,J.
Pub. info.: In-Line Methods and Monitors for Process and Yield Improvement.  pp.112-115,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3884
5.

Conference Proceedings
Conference Proceedings
5. Evaluation of a next-generation vector electron-beam mask pattern lithography system
Rose,C. ; Wang,L.C. ; Justen,J.P. ; Ferreira,M.
Pub. info.: 17th Annual BACUS Symposium on Photomask Technology and Management.  pp.64-73,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3236