1.

Conference Proceedings

Conference Proceedings
Hoffman,M.J. ; Wakayama,S. ; Kishi,T. ; Mai,Y.-W. ; Kawahara,M.
Pub. info.: Nondestructive characterization of materials VII : proceedings of the seventh International Symposium on Nondestructive Characterization of Materials held in Prague, Czech Republic, June 1995.  pp.487-494,  1996.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 210-213
2.

Conference Proceedings

Conference Proceedings
Kim,B.N. ; Kinoshita,T. ; Wakayama,S. ; Kawahara,M. ; Mayo,M.J.
Pub. info.: Superplasticity in advanced materials : ICSAM-94 : proceedings of the 1994 International Conference on Superplasticity in Advanced Materials (ICSAM-94), held at the Russian Academy of Administration in Moscow on May 24-26, 1994.  pp.391-396,  1994.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 170-172
3.

Technical Paper

Technical Paper
Wakayama,S.
Pub. info.: 7th AIAA/USAF/NASA/ISSMO Symposium on Multidisciplinary Analysis and Optimization : a collection of technical papers, September 2-4, 1998/St. Louis, Missouri.  pt. 3  pp.1771-1779,  1998.  Reston, VA.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : Symposium on Multidisciplinary Analysis and Optimization
Ser. no.: CP9811
4.

Technical Paper

Technical Paper
Wakayama,S. ; Kroo,I.
Pub. info.: 7th AIAA/USAF/NASA/ISSMO Symposium on Multidisciplinary Analysis and Optimization : a collection of technical papers, September 2-4, 1998/St. Louis, Missouri.  pt. 1  pp.239-250,  1998.  Reston, VA.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : Symposium on Multidisciplinary Analysis and Optimization
Ser. no.: CP9811
5.

Conference Proceedings

Conference Proceedings
Umeda,N. ; Wakayama,S. ; Arakawa,S. ; Takayanagi,A. ; Kohwa,H.
Pub. info.: International Symposium on Polarization Analysis and Applications to Device Technology.  pp.119-122,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2873