Ultrafast phenomena in semiconductors III : 27-29 January, 1999, San Jose, California. pp.79-89, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Ultrafast phenomena in semiconductors IV : 27-28 January 2000, San Jose, California. pp.91-97, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Lider remote sensing for industry and environment monitoring : 9-12 October 2000, Sendai, Japan. pp.559-566, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Remote sensing of clouds and the atmosphere VI : 17-20 September 2001, Toulouse, France. pp.116-124, 2001. Bellingham, Wash. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Laser radar technology and applications IV : 6-9 April 1999, Orlando, Florida and 16 June 1999, Munich, Germany. pp.70-79, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Application of tunable diode and other infrared sources for atmospheric studies and industrial process monitoring : 8-9 August 1996, Denver, Colorado. pp.142-147, 1996. Bellingham, WA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Physics and Simulation of Optoelectronic Devices VI. Part 2 pp.602-613, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering