1.

Conference Proceedings
Conference Proceedings
1. Reliability of Copper Metallization for CMOS ULSI Technologies
Rathore, H.S. ; Nguyen, D.B. ; Agarwala, B. ; Wachnik, R.A. ; Procter, R.W.
Pub. info.: Interconnect and contact metallization for ULSI : proceedings of the international symposium.  pp.190-197,  1999.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-31
2.

Conference Proceedings
Conference Proceedings
2. Low Electric Field Time-Dependent Dielectric Breakdown for BEOL Capacitor Application
Nguyen, D.B. ; Wachnik, R.A. ; Rathore, H.S. ; Kane, T.
Pub. info.: Proceedings of the Symposium on Reliability of Metals in Electronics.  pp.16-22,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-3