1.

Conference Proceedings
Conference Proceedings
1. ACCEPTOR-DONOR-INTERACTIONS IN SILICON STUDIED BY THE PAC METHOD.
FORKEL,D. ; FOFTTINGER,H. ; IWATSCHENKO-BORHO,M. ; MALZER,S. ; MEYER,F. ; WITTHUHN,W. ; WOLF,H.
Pub. info.: Defects in Semiconductors : Proceedings of the 14th International Conference on Defects in Semiconductors, ICDS-14, Paris, France, August 18-22, 1986.  Part2  pp.557-562,  1986.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 10-12
2.

Conference Proceedings
Conference Proceedings
2. ACCEPTORS AND DONORS IN THE WIDE-GAP SEMICON-DUCTORS ZnO AND SnO2.
WOLF,H. ; DEUBLER,S. ; FORKEL,D. ; FOETTINGER,H. ; IWATSCHENKO,M. ; SCHENKO-BORHO ; MEYER,F. ; RENN,M. ; WITTHUHN,W.
Pub. info.: Defects in Semiconductors : Proceedings of the 14th International Conference on Defects in Semiconductors, ICDS-14, Paris, France, August 18-22, 1986.  Part3  pp.863-867,  1986.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 10-12