E. F. Chillcce ; W. M. Faustino ; G. J. Jacob ; E. Rodriguez ; W. M. Moreira ; C. L. Cesar ; L. C. Barbosa
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Optical components and materials IV : 22-24 January 2007, San Jose, California, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
A. A. de Thomaz ; W. M. Faustino ; A. Fontes ; H. P. Fernandes ; M. d. L. Barjas-Castro ; K. Metze ; S. Giorgio ; L. C. Barbosa ; C. L. Cesar
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Optical trapping and optical micromanipulation IV : 26-29 August 2007, San Diego, California, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
D. B. Almeida ; W. M. Faustino ; G. J. Jacob ; A. A. de Thomaz ; L C. Barbosa
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Nanophotonic materials V : 10-12 August 2008, San Diego, California, USA. pp.70300I-1-70300I-8, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
A. A. de Thomaz ; D. B. Almeida ; W. M. Faustino ; G. J. Jacob ; A. Fontes
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Optical trapping and optical micromanipulation V : 10-13 August, 2008, San Diego, California, USA. pp.703810-1-703810-8, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
G. J. Jacob ; D. B. Almeida ; W. M. Faustino ; E. Rodrigues ; C. H. Brito
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Ultrafast phenomena in semiconductors and nanostructure materials XII : 20-23 January 2008, San Jose, California, USA. pp.689207-1-689207-5, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
G. J. Jacob ; D. B. Almeida ; W. M. Faustino ; E. F. Chillcce ; E. Rodriguez
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Quantum dots, particles, and nanoclusters V : 21 January, 2008, San Jose, California, USA. pp.690206-1-690206-5, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering