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19 results

Conference Proceedings

1. The Effect of Hot Extrusion on the Structure and Thermoelectric Properties of Bi2Te3 Material

X.Q. Liu ; W. Ren ; W. Han ; X.L. Wang

Pub. info.:	Progress in powder metallurgy : proceedings of the 2006 Powder Metallurgy World Congress & Exhibition (PM 2006), held in Busan Exhibition & Convention Center (BEXCO), Busan, Korea, September 24-28, 2006. pp.1549-1552, 2007. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	534-536

Conference Proceedings

2. Effect of Gas Temperature on the Particle Deposition Characteristics and Coating Microstructure by Cold Spray

X.M. Meng ; J.B. Zhang ; Y.L. Liang ; W. Han ; J. Zhao

Pub. info.:	Advanced material science and technology : selected, peer reviewed papers from the 7th International Forum on Advanced Material Science and Technology, June 26-28, 2011, Dalian, China (IFAMST-7). pp.1295-1298, 2011. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	675-677

Conference Proceedings

3. Phase Structure and Hydrogen Storage Characterization of the As-Cast Mg-10Ni-2Mm Alloy

N. Xing ; P.C. Bai ; Y. Wu ; Z.C. Lu ; W. Han

Pub. info.:	Energy and environment materials : selected, peer reviewed papers from the 2009 C-MRS annual meeting on Energy and Environmental Materials, held in Suzhou, China, Oct. 15-17, 2009. pp.150-156, 2010. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	650

Conference Proceedings

4. Bismuth/Glassy Carbon Composite Electrode for the Determination of Trace Lead and Cadmium

G. Hwang ; S. Hong ; W. Han ; J. Park ; S. Kang

Pub. info.:	Chemical Sensors 8 : chemical (gas, ion ,bio) sensors and analytical systems. pp.557-565, 2008. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	16(11)

Conference Proceedings

5. Synthesis, Electrical Properties and Chemical Stability of BaCe_0.7In_0.3-xGd_xO_3-δ

J.H. Xu ; W. Han ; H. Ding ; W.J. Chen ; J. Xiang

Pub. info.:	Functional and Functionally Structured Materials : Selected, peer reviewed papers from the Chinese Materials Conference 2015, July 10-14, 2015, Guiyang, China. pp.401-412, 2016. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	848

Technical Paper

6. An Integrated-Electro-Hydraulic Brake System for Active Safety

Z. Yu ; S. Xu ; L. Xiong ; W. Han

Pub. info.:	2016 SAE World Congress Exhibition : technical paper. 2016. Warrendale, Penn.. Society of Automotive Engineers
Title of ser.:	Society of Automotive Engineers technical paper series
Ser. no.:	2016

Conference Proceedings

7. Virtual OPC at hyper NA lithography

S. Lee ; S. Kim ; Y. Chun ; S. Suh ; Y. Jang ; S. Choi ; W. Han

Pub. info.:	Optical microlithography XX. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6520

Conference Proceedings

8. Detailed analysis of capability and limitations of CD scatterometry measurements for 65- and 45-nm nodes

I. Pundaleva ; R. Chalykh ; J. Lee ; S. Choi ; W. Han

Pub. info.:	Metrology, inspection, and process control for microlithography XXI. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6518

Conference Proceedings

9. Optical performance enhancement technique for 45-nm-node with binary mask

J. Jung ; H. Kim ; J. Lee ; S. Choi ; W. Han

Pub. info.:	Optical microlithography XX. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6520

10.

Conference Proceedings

10. Phase-shifted assist feature OPC for sub-45-nm node optical lithography

G. Yoon ; H. Kim ; J. Lee ; S. Choi ; W. Han

Pub. info.:	Optical microlithography XX. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6520

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