1.

Conference Proceedings

Conference Proceedings
Gordeev, S.I. ; Galkin, S.N. ; Kostyukevich, S.A. ; Lalayants, A.I. ; Ryzhikov, V.D. ; Tolmachev, A.V. ; Voronkin, E.F. ; Lisetskaja, E.K.
Pub. info.: Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA.  pp.380-388,  2003.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5188
2.

Conference Proceedings

Conference Proceedings
Ryzhikov, V.D. ; Gal'chinetskii, L.P. ; Galkin, S.N. ; Lalayants, A.I. ; Lysetska, E.K. ; Silin, V.I. ; Starzhinskiy, N.G. ; Voronkin, E.F. ; Kostyukevich, S.A.
Pub. info.: Hard X-Ray and Gamma-Ray Detector Physics VI.  pp.235-240,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5540