1.

Conference Proceedings
Conference Proceedings
1. FibDAC - Residual Stress Determination by Combination of Focused Ion Beam Technique and Digital Image Correlation
Keller, J. ; Gollhardt, A. ; Vogel, D. ; Auerswald, E. ; Sabate, N. ; Auersperg, J. ; Michel, B.
Pub. info.: Residual stresses VII : ECRS 7 : proceedings of the 7th European conference on residual stresses, Berlin, Germany, 13-15 September 2006.  pp.121-128,  2006.  Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 524-525
2.

Conference Proceedings
Conference Proceedings
2. Nanoscale deformation measurements for reliability analysis of sensors
Keller, J. ; Gollhard, A. ; Vogel, D. ; Michel, B.
Pub. info.: Advanced sensor technologies for nondestructive evaluation and structural health monitoring : 8-10 March 2005, San Diego, California, USA.  pp.160-167,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5770
3.

Conference Proceedings
Conference Proceedings
3. 3D deformation analysis of flow and gas sensors membranes for reliability assessment
Sabate, N. ; Keller, J. ; Gollhardt, A. ; Vogel, D. ; Gracia, I. ; Cane, C. ; Morante, J. R. ; Michel, B.
Pub. info.: Smart sensors, actuators, and MEMS II : 9-11 May 2005, Seville, Spain.  pp.416-424,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5836
4.

Conference Proceedings
Conference Proceedings
4. Characterization of electronic packaging materials and components by image correlation methods
Vogel, D. ; Auersperg, J. ; Michel, B.
Pub. info.: Advanced photonic sensors and applications II : 27-30 November 2001, Singapore.  pp.237-247,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4596
5.

Conference Proceedings
Conference Proceedings
5. How to detect Edgar Allan Poe's 'purloined letter,' or cross-correlation algorithms in digitized video images for object identification, movement evaluation, and deformation analysis
Dost, M. ; Vogel, D. ; Winkler, T. ; Vogel, J. ; Erb, R. ; Kieselstein, E. ; Michel, B.
Pub. info.: Nondestructive detection and measurement for homeland security : 4-5 March, 2003, San Diego, California, USA.  pp.73-82,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5048
6.

Conference Proceedings
Conference Proceedings
6. Micro/nano-DAC deformation measurement to analyze packaging components response to thermomechanical load
Vogel, D. ; Gollhardt, A. ; Michel, B.
Pub. info.: Design, test, integration, and packaging of MEMS/MOEMS 2002 : 6-8 May, 2002, Cannes, France.  pp.736-747,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4755
7.

Conference Proceedings
Conference Proceedings
7. Evaluating microdefect structures by AFM-based deformation measurement
Vogel, D. ; Keller, J. ; Gollhardt, A. ; Michel, B.
Pub. info.: Testing, Reliability, and Application of Micro- and Nano-Material Systems.  pp.1-12,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5045
8.

Conference Proceedings
Conference Proceedings
8. FIB based measurement of local residual stresses on microsystems (Invited Paper) [6175-06]
Vogel, D. ; Sabate, N. ; Gollhardt, A. ; Keller, J. ; Auersperg, J. ; Michel, B.
Pub. info.: Testing, Reliability, and Application of Micro- and Nano-Material Systems IV.  pp.617505-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6175
9.

Conference Proceedings
Conference Proceedings
9. Nanoscale deformation measurements for reliability assessment of material interfaces [6175-05]
Keller, J. ; Gollhardt, A. ; Vogel, D. ; Michel, B.
Pub. info.: Testing, Reliability, and Application of Micro- and Nano-Material Systems IV.  pp.617504-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6175
10.

Conference Proceedings
Conference Proceedings
10. Deformation field measurement on micro and nanotechnology components utilizing SFM and FIB equipment [5852-49]
Vogel, D. ; Keller, J. ; Gollhardt, A. ; Michel, B.
Pub. info.: Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics.  pp.302-308,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5852