1.

Conference Proceedings
Conference Proceedings
1. Influence of semiconductor structure inhomogeneity on electrophysical measurement results
Savitsky,V.G. ; Vlasov,A. ; Nemolovsky,A.V. ; Sokolovsky,B.S.
Pub. info.: Fourth International Conference on Material science and material properties for infrared optoelectronics : 29 September-2 October 1998, Kiev, Ukraine.  pp.343-347,  1999.  Bellingham, Washington.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3890
2.

Conference Proceedings
Conference Proceedings
2. Spatial distribution of thermal conductivity of diamond wafers as measured by laser flash technique
Ralchenko,V.G. ; Vlasov,A. ; Vlasov,I.I. ; Zubov,B.V. ; Nikitin,A.P. ; Khomich,A.V.
Pub. info.: Lasers in Synthesis, Characterization, and Processing of Diamond.  pp.214-221,  1997.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3484