1.

Conference Proceedings
Conference Proceedings
1. Development of Inverse TLDD Technique at CEERI
Andhare,P.N. ; Pant,B.D. ; Eranna,G. ; Virdi,G.S. ; Soni,R.N. ; Wadhawan,O.P.
Pub. info.: Proceedings of the Tenth International Workshop on the Physics of Semiconductor Devices (December 14-18, 1999).  Part2  pp.815-818,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3975
2.

Conference Proceedings
Conference Proceedings
2. Swift Heavy Ion Induced Recrystallization Studies of Top Silicon Layer on Silicon-on-Insulator(SOI)Structure by Atomic Force Microscopy
Singh,Rajendra ; Arora,S.K. ; Kumar,Ravi ; Virdi,G.S. ; Ganesan,V. ; Avasthi,D.K. ; Kanjilal,D.
Pub. info.: Proceedings of the Tenth International Workshop on the Physics of Semiconductor Devices (December 14-18, 1999).  Part2  pp.904-907,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3975
3.

Conference Proceedings
Conference Proceedings
3. Study of Damaged Top Layers of Silicon Crystals Produced by BF2+ Implantation by High Resolution X-ray Diffraction
Lal,Krishan ; Bhagavannarayana,G. ; Virdi,G.S.
Pub. info.: Semiconductor Devices.  pp.493-495,  1996.  Bellingham, WA, New Delhi.  SPIE-The International Society for Optical Engineering — Narosa
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2733
4.

Conference Proceedings
Conference Proceedings
4. Study of Lifetime of Minority Carriers in Phosphorous and Boron Ion Implanted n-Type Silicon
Chavan,Sharad T. ; Virdi,G.S. ; Bhoraskar,Vasant N.
Pub. info.: Semiconductor Devices.  pp.490-492,  1996.  Bellingham, WA, New Delhi.  SPIE-The International Society for Optical Engineering — Narosa
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2733