1.

Conference Proceedings
Conference Proceedings
1. Characterization of Porous SiC Substrates and of the Epilayer Structures Grown on Them
Raghothamachar, Balaji ; Bai, Jie ; Vetter, William M. ; Gouma, Perena ; Dudley, Michael ; Mynbaeva, Marina ; Smith, Matthew T. ; Saddow, Stephen E.
Pub. info.: Silicon carbide 2002 -- materials, processing and devices : symposium held December 2-4, 2002, Boston, Massachusetts, U.S.A..  pp.109-114,  2003.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 742
2.

Conference Proceedings
Conference Proceedings
2. Investigations Of Non-Micropipe X-Ray Imaged Crystal Defects In SiC Devices
Neudeck, Philip G. ; Kuczmarski, Maria A. ; Dudley, Michael ; Vetter, William M. ; Su, Haibin B. ; Keys, Luann J. ; Trunek, Andrew J.
Pub. info.: Wide-bandgap electronic devices.  pp.T1.2-,  2001.  Warrendale, PA..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 622