Search records | 東京工業大学附属図書館文献データベース

Sort order

2 results

Conference Proceedings

1. THE MEYER-NELDEL RELATION AND ANALYSIS OF THE FIELD-EFFECT IN AMORPHOUS SILICON

Schropp, Ruud E.I. ; Snijder, Jan ; Verwey, Jan F

Pub. info.:	Materials issues in amorphous-semiconductor technology : symposium held April 15-18, 1986, Palo Alto, California, U.S.A.. pp.173-178, 1986. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	70

Conference Proceedings

2. CAPACITANCE-VOLTAGE CHARACTERISTICS OF METALLIC GATE/OXIDE/a-Si:H MOS STRUCTURES

Schropp, Ruud E.I. ; Snijder, Jan ; Verwey, Jan F

Pub. info.:	Materials issues in amorphous-semiconductor technology : symposium held April 15-18, 1986, Palo Alto, California, U.S.A.. pp.167-172, 1986. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	70