1.

Conference Proceedings
Conference Proceedings
1. Extremely High-Density Capacitors with ALD High-k Dielectric Layers
Klootwijk, J. ; Kemmeren, A. ; Wolters, R. ; Roozeboom, F. ; Verhoeven, J. ; Van Den Heuvel, E.
Pub. info.: Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices.  pp.17-29,  2006.  Dordrecht.  Springer
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 220
2.

Conference Proceedings
Conference Proceedings
2. High-brightness compact soft x-ray source based on Cherenkov radiation
Knulst, W. ; van der Wiel, M. J. ; Luiten, O. J. ; Verhoeven, J.
Pub. info.: Laser-generated and other laboratory X-ray and EUV sources, optics, and applications : 4-6 August 2003, San Diego, California, USA.  pp.393-404,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5196
3.

Conference Proceedings
Conference Proceedings
3. High-Density, Low-Loss MOS Decoupling Capacitors Integrated in a GSM Power Amplifier
Roozeboom, F. ; Kemmeren, A. ; Verhoeven, J. ; van den Heuvel, E. ; Kretschman, H. ; Fric, T.
Pub. info.: Materials, integration and packaging issues for high-frequency devices.  pp.157-164,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 783