1.

Conference Proceedings

Conference Proceedings
Verdiell,J.-M.
Pub. info.: Testing, packaging, reliability, and applications of semiconductor lasers IV : 28 January 1999, San Jose, California.  pp.176-187,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3626
2.

Conference Proceedings

Conference Proceedings
Whitlock,B.K. ; Verdiell,J.-M.
Pub. info.: Design and manufacturing of WDM devices : 4-5 November 1997, Dallas, Texas.  pp.83-93,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3234
3.

Conference Proceedings

Conference Proceedings
Verdiell,J.-M. ; Sanders,S. ; Major,J.S. ; Welch,D.F. ; Scifres,D.R.
Pub. info.: Wavelength Division Multiplexing Components.  pp.286-295,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2690
4.

Conference Proceedings

Conference Proceedings
Verdiell,J.-M. ; Ziari,M. ; Mathur,A. ; Koch,T.L.
Pub. info.: High-Speed Semiconductor Lasers for Communication.  pp.67-77,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3038
5.

Conference Proceedings

Conference Proceedings
Verdiell,J.-M. ; Lang,R.J. ; Dzurko,K.M. ; O'Brien,S. ; Osinski,J.S. ; Welch,D.F. ; Scifres,D.R.
Pub. info.: High-Speed Semiconductor Laser Sources.  pp.108-117,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2684