1.

Conference Proceedings
Conference Proceedings
1. Ultra-Shallow Junction Formation Using Ion Implantation and Rapid Thermal Annealing: Physical and Practical Limits
Agarwal, A. ; Gossmann, H.-J.L. ; Fiory, A.T. ; Venezia, V.C. ; Jacobson, D.C.
Pub. info.: Rapid thermal and other short-time processing technologies : proceedings of the international symposium.  pp.49-60,  2000.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-9
2.

Conference Proceedings
Conference Proceedings
2. VACANCY SUPERSATURATION PRODUCED BY HIGH-ENERGY ION IMPLANTATION
Venezia, V.C. ; Eaglesham, D.J. ; Haynes, T.E. ; Agarwal, A. ; Jacobson, D.C. ; Gossmann, H.-J. ; Friessnegg, T. ; Nielsen, B.
Pub. info.: Silicon materials science and technology : proceedings of the Eighth International Symposium on Silicon Materials Science and Technology.  pp.926-937,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-1(2)
3.

Conference Proceedings
Conference Proceedings
3. THE ROLE OF IMPLANTATION DAMAGE IN THE PRODUCTION OF SILICON-ON-INSULATER FILMS BY CO-IMPLANTATION OF HE+ AND H+
Venezia, V.C. ; Haynes, T.E. ; Agarwal, A. ; Eaglesham, D.J. ; Holland, O.W. ; Weldon, M.K. ; Chabal, Y.J.
Pub. info.: Silicon materials science and technology : proceedings of the Eighth International Symposium on Silicon Materials Science and Technology.  pp.1385-1394,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-1(2)
4.

Conference Proceedings
Conference Proceedings
4. Dopant Diffusion in Amorphous Silicon
Duffy, R. ; Venezia, V.C. ; Heringa, A. ; Hopstaken, M.J.P. ; Maas, G.C.J. ; Dao, T. ; Tamminga, Y. ; Roozeboom, F.
Pub. info.: Silicon front-end junction formation : physics and technology : symposium held April 13-15, 2004, San Francisco, California, U.S.A..  pp.437-442,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 810
5.

Conference Proceedings
Conference Proceedings
5. Compact modeling of noise for RF CMOS circuit simulation (Invited Paper)
Scholten, A.J. ; Tiemeijer, L.F. ; Van Langevelde, R. ; Havens, R.J. ; Zegers-van Duijnhoven, A.T.A.Z. ; de Kort, R. ; Venezia, V.C. ; Klaassen, D.B.M.
Pub. info.: Noise in Devices and Circuits.  pp.93-104,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5113