1.

Conference Proceedings
Conference Proceedings
1. X-RAY DIAGNOSTICS OF LARGE-PERIOD LATTICE-MATCHED InGaAs/InP SUPERLATTICES
Vandenberg, J.M. ; Ritter, D. ; Hamm, R.A. ; Chu, S.N.G. ; Panish, M.B.
Pub. info.: Semiconductor heterostructures for photonic and electronic applications : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A..  pp.103-108,  1993.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 281
2.

Conference Proceedings
Conference Proceedings
2. ELECTRICAL TRANSPORT AND IN-SITU X-RAY STUDIES OF THE FORMATION OF TiSi2 THIN FILMS ON Si
Hensel, J.C. ; Vandenberg, J.M. ; Mattheiss, L.F. ; Unterwald, F.C. ; Maury, A.
Pub. info.: Interfaces, superlattices, and thin films : symposium held December 1-6, 1986, Boston, Massachusetts, U.S.A..  pp.737-742,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 77
3.

Conference Proceedings
Conference Proceedings
3. Laser and ion beam mixing Cr and Ni + Cr films on Cu
Draper, C.W. ; Jacobson, D.C. ; Gisbon, J.M. ; Poate, J.M. ; Vandenberg, J.M. ; Cullis, A.G.
Pub. info.: Laser and electron-beam interactions with solids : proceedings of the Materials Research Society Annual Meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A..  pp.413-418,  1982.  New York.  North Holland
Title of ser.: Materials Research Society symposia proceedings
Ser. no.: 4
4.

Conference Proceedings
Conference Proceedings
4. Studies of laser-alloyed Zr-containing surface layers
Draper, C.W. ; Den Broeder, F.J.A. ; Jacobson, D.C. ; Kaufmann, E.N. ; McDonald, M.L. ; Vandenberg, J.M.
Pub. info.: Laser and electron-beam interactions with solids : proceedings of the Materials Research Society Annual Meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A..  pp.419-424,  1982.  New York.  North Holland
Title of ser.: Materials Research Society symposia proceedings
Ser. no.: 4
5.

Conference Proceedings
Conference Proceedings
5. FORMATION OF NEW INTERFACIAL PHASES IN BIMETALLIC THIN FILM COUPLES STUDIED BY IN-SITU ANNEALING X-RAY DIFFRACTION
Vandenberg, J.M.
Pub. info.: Thin films : interfaces and phenomena : symposium held December 2-6, 1985, Boston, Massachusetts, USA.  pp.171-174,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 54
6.

Conference Proceedings
Conference Proceedings
6. X-Ray Microbeam Techniques and Applications
Isaacs, E.D. ; Evans-Lutterodt, K. ; Marcus, M.A. ; Macdowell, A.A. ; Lehnert, W. ; Vandenberg, J.M. ; Sputz, S. ; Johnson, J.E. ; Grenko, J. ; Ketelsen, L.J.P. ; Pinzone, C. ; Glew, R. ; Yun, W. ; Cai, Z. ; Rodrigues, W. ; Lee, H.-R. ; Lai, B.
Pub. info.: Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.49-59,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-12