1.

Conference Proceedings
Conference Proceedings
1. Dislocation Reduction of GaAs and AlGaAs on Si Substrate for High Efficiency Solar Cell
Soga,T. ; Yang,M. ; Kato,T. ; Jimbo,T. ; Umeno,M.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1779-1784,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
2.

Conference Proceedings
Conference Proceedings
2. Deep Electron Trap Studies of GaAlAS/GaAs Single and Multiple Quantum Well Lasers Fabricated on Si Substrate by MOCVD
Liwu,L. ; Jie,Z. ; Wanru,Z. ; Umeno,M.
Pub. info.: Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992.  pp.351-356,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 117-118
3.

Conference Proceedings
Conference Proceedings
3. Room Temperature Defect Etching of III-V Compounds and AIloys Grown on Si Substrate Using Hydrogen Fluoride and Nitric Acid
Nishikawa,H. ; Soga,T. ; Jimbo,T. ; Umeno,M.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1923-1926,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
4.

Conference Proceedings
Conference Proceedings
4. High Quality GaAs on Si Grown by CBE
Uchida,H. ; Adachi,M. ; Egawa,T. ; Nishikawa,H. ; Jimbo,T. ; Umeno,M.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.535-538,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
5.

Conference Proceedings
Conference Proceedings
5. Novel Technique for Reliable AlGaAs/GaAs Light Emitting Diodes on Si Using GaAs Islands Active Regions
Hasegawa,Y. ; Egawa,T. ; Jimbo,T. ; Umeno,M.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1933-1938,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201