Tsuda, H. ; Ju, D. Y. ; Uchiyama, T. ; Sunayama, Y. ; Oba, R.
Pub. info.:
Residual stresses VII : ICRS 7 : proceedings of the 7th International Conference on Residual Stresses, ICRS-7 Xi'an, China, 14-17, June, 2004. pp.364-369, 2005. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Fukuda, H. ; Uchiyama, T. ; Haneishi, H. ; Yamaguchi, M. ; Ohyama, N.
Pub. info.:
Color imaging X : processing, hardcopy, and applications : 17-20 January 2005, San Jose, California, USA. pp.136-145, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Kan,H. ; Miyajima, H. ; Furuta, S. ; Suzuki, H. ; Uchiyama, T. ; Oishi, S. ; Kanzaki, T. ; Hiruma, T.
Pub. info.:
First International Symposium on High-Power Laser Macroprocessing : 27-31 May 2002, Osaka, Japan. pp.1-3, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Kaneta, C. ; Yamasaki, T. ; Uchiyama, T. ; Uda, T. ; Terakura, K.
Pub. info.:
Structure and electronic properties of ultrathin dielectric films on silicon and related structures : symposium held November 29-December 1, 1999, Boston, Massachusetts, U.S.A.. pp.39-, 2000. Warrendale, PA. MRS-Materials Research Society
Naruse, H. ; Uchiyama, T. ; Kurashima, T. ; Unno, S.
Pub. info.:
OFS-13 : 13th International Conference on Optical Fiber Sensors & Workshop on Device and System Technology toward Future Optical Fiber Communication and Sensing : April 12-16, 1999, Kyongju Hyundai Hotel, Kyongju, Korea. pp.502-505, 1999. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ju, D.Y. ; Uchiyama, T. ; Machida, H. ; Kanawa, T. ; Oba, R. ; Sunayama, Y. ; Tsuda, H.
Pub. info.:
ECRS 6 : proceedings of the 6th European Conference on Residual Stresses, Coimbra, Portugal, 10-12 July, 2002. pp.635-640, 2002. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Yamasaki, T. ; Kaneta, C. ; Uchiyama, T. ; Uda, T. ; Terakura, K.
Pub. info.:
The physics and chemistry of SiO2 and the Si-SiO2 interface-4, 2000 : proceedings of the fourth International Symposium on the Physics and Chemistry of SiO2 and the Si-SiO2 Interface, Tronto, Canada, May 15-18, 2000. pp.295-306, 2000. Pennington, N.J.. Electrochemical Society
Yamagachi, M. ; Teraji, T. ; Ohsawa, K. ; Uchiyama, T. ; Motomura, H. ; Murakami, Y. ; Ohyama, N.
Pub. info.:
Color imaging : device-independent color, color hardcopy, and applications VII : 22-25 January, 2002, San Jose, USA. pp.15-26, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering