1.

Conference Proceedings

Conference Proceedings
Wasik,D. ; Dmowski,L. ; Mikucki,J. ; Lusakowski,J. ; Hsu,L. ; Walukiewicz,W. ; Bi,W.G. ; Tu,C.W.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.813-818,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings

Conference Proceedings
Tu,C.W. ; Han,Y.A. ; Lee,C.K. ; Wu,J.W.J. ; Peng,A.S.T. ; Liao,E.H.Z. ; Lee,J.T.
Pub. info.: Practical holography XIII : 25 January 1999, San Jose, California.  pp.130-140,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3637
3.

Conference Proceedings

Conference Proceedings
Shan,W. ; Walukiewicz,W. ; Yu,K.M. ; III,J.W.Ager ; Haller,E.E. ; Geisz,J.F. ; Friedman,D.J. ; Olson,J.M. ; Kurtz,S.R. ; Xin,H.P. ; Tu,C.W.
Pub. info.: Physics and simulation of optoelectronic devices VIII : 24-28 January 2000, San Jose, USA.  Part1  pp.69-79,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3944
4.

Conference Proceedings

Conference Proceedings
Ourmazd,A. ; Cunningham,J. ; Taylor,D.W. ; Rentschler,J.A. ; Tu,C.W.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part2  pp.689-694,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
5.

Conference Proceedings

Conference Proceedings
Chen,W.M. ; Buyanova,I.A. ; Bi,W.G. ; Tu,C.W.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.805-812,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
6.

Conference Proceedings

Conference Proceedings
Chen,W.M. ; Dreszer,P. ; Leon,R. ; Sorman,E.R.Weber E. ; Monemar,B. ; Liang,B.W. ; Tu,C.W.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.211-216,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
7.

Conference Proceedings

Conference Proceedings
Dreszer,P. ; Chen,W.M. ; Wasik,D. ; Walukiewicz,W. ; Liang,B.W. ; Tu,C.W. ; Weber,E.R.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.1081-1086,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
8.

Conference Proceedings

Conference Proceedings
Liao,H.H. ; Mei,X.B. ; Loi,K.K. ; Tu,C.W. ; Asbeck,P.M. ; Chang,W.S.C.
Pub. info.: Optoelectronic Integrated Circuits.  pp.291-300,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3006
9.

Conference Proceedings

Conference Proceedings
Liao,H.H. ; Mei,X.B. ; Loi,K.K. ; Tu,C.W. ; Yu,P.K.L. ; Asbeck,P.M. ; Chang,W.S.C.
Pub. info.: Photonics and Radio Frequency.  pp.97-107,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2844
10.

Conference Proceedings

Conference Proceedings
Loi,K.K. ; Mei,X.B. ; Tu,C.W. ; Chang,W.S.C.
Pub. info.: Photonics and Radio Frequency.  pp.84-90,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2844