1.

Conference Proceedings
Conference Proceedings
1. PERIODICITIES IN THE X-RAY DIFFRACTION OF LOW ORDER AlAs/GaAs SUPERLATTICES
Pelegrino, Joseph ; Qadri, S. ; Tseng, W. ; Miller, W. R. ; Comas, J.
Pub. info.: Phase transformation kinetics in thin films : symposium held April 29-May 1, 1991, Anaheim, California, U.S.A..  pp.219-224,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 230
2.

Conference Proceedings
Conference Proceedings
2. A STUDY OF INTERFACES IN GaAs/AlAs SUPERLATTICES USING PHONONS
Gammon, D. ; Shanabrook, B.V. ; Prokes, S. ; Katzer, D.S. ; Tseng, W. ; Wilkins, B. ; Dietrich, H.
Pub. info.: Atomic scale structure of interfaces : symposium held November 27-29, 1989, Boston Massachusetts, U.S.A..  pp.357-364,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 159
3.

Conference Proceedings
Conference Proceedings
3. STUDY OF INTERFACIAL SHARPNESS AND GROWTH IN (GaAs)m(AlAs)n SUPERLATTICES
Gammon, D. ; Prokes, S. ; Katzer, D.S. ; Shanabrook, B.V. ; Fatemi, M. ; Tseng, W. ; Wilkins, B. ; Dietrich, H.
Pub. info.: Atomic scale structure of interfaces : symposium held November 27-29, 1989, Boston Massachusetts, U.S.A..  pp.339-344,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 159
4.

Conference Proceedings
Conference Proceedings
4. DEFECTS OM GaAs AS REVEALED BY CHEMICAL ETCHING
Lessoff, H. ; Tseng, W.
Pub. info.: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.397-402,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 46
5.

Conference Proceedings
Conference Proceedings
5. Identifying process window marginalities of reticle designs for 0.15/0.13-μm technologies
Lo, S.C. ; Hsieh, L.K. ; Yeh, J.B. ; Pai, Y.-C. ; Tseng, W. ; Lin, M. ; Peterson, I.B.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology X.  pp.829-837,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5130
6.

Conference Proceedings
Conference Proceedings
6. Advanced e-beam CAR resist evaluation for 65nm generation [5992-112]
Chan, G. ; Lin, O. ; Tseng, W. ; Lee, B. ; Huang, T. ; Kozuma, M.
Pub. info.: 25th Annual BACUS Symposium on Photomask Technology.  pp.59923B-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5992
7.

Conference Proceedings
Conference Proceedings
7. Characterization of repairs to KrF 300-mm wafer printability for 0.13-pm design rule with attenuated phase-shifting mask
Chou, W. ; Chen, T. ; Tseng, W. ; Huang, P. ; Tseng, C.C. ; Chung, M. ; Wang, D. ; Huang, N.
Pub. info.: 22nd Annual BACUS Symposium on Photomask Technology.  Part One  pp.498-508,  2002.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4889