Search records | 東京工業大学附属図書館文献データベース

You can search for articles included in proceedings of international conferences and technical papers which Tokyo Tech Library holds.
Tokyo Tech members can obtain tables of contents of 17,000 foreign journals by SwetScan. Tokyo Tech Library does not cover all of them.
List of Searchable Databases

Clear Form

Search for other sites by same keyword(s).

CiNii Books

NDL Search

WebcatPlus

amazon

カーリル

WorldCat

Filter

Title:

Author:

ISBN / ISSN / Paper No:

Source Title:

Publisher:

Publication Year:

～

Clear Form

Type:

Conference Proceedings

Technical Paper

Academic Journal

Select: Check all | Remove all

Sort order

10 | 50 | 100 / Per Page

20 results

Conference Proceedings

1. Restoration of blurred images by edge detection

Dupasquier, a. ; Nicolier, F. ; Delcroix, G. ; Truchetet, F. ; Laligant, O.

Pub. info.:	Intelligent robots and computer vision XVII : Algorithms, techniques, and active vision : 2-3 November 1998 Boston, Massachusetts. pp.213-222, 1998. Bellingham, Wash., USA. SPIE
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3522

Conference Proceedings

2. B-spline quincunx wavelet transform and implementation in Fourier domain

Nicolier, F. ; Laligant, O. ; Truchetet, F.

Pub. info.:	Intelligent robots and computer vision XVII : Algorithms, techniques, and active vision : 2-3 November 1998 Boston, Massachusetts. pp.223-234, 1998. Bellingham, Wash., USA. SPIE
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3522

Conference Proceedings

3. A method searching an optimal lighting : application to defect detection by artificial vision in industrial field

Geveaux, P. ; Kohler, S. ; Miteran, J. ; Truchetet, F.

Pub. info.:	Intelligent robots and computer vision XVII : Algorithms, techniques, and active vision : 2-3 November 1998 Boston, Massachusetts. pp.124-129, 1998. Bellingham, Wash., USA. SPIE
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3522

Conference Proceedings

4. A multi-scale analysis for the characterization of 3D objects

Toubin, M. ; Lalligant, O. ; Diou, A. ; Truchetet, F. ; Verrecchia, E.P. ; Dumont, C. ; Abidi, M.A.

Pub. info.:	Intelligent robots and computer vision XVII : Algorithms, techniques, and active vision : 2-3 November 1998 Boston, Massachusetts. pp.414-423, 1998. Bellingham, Wash., USA. SPIE
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3522

Conference Proceedings

5. A wavelet filter performance criterion

Nicolier, F. ; Truchetet, F.

Pub. info.:	Wavelet Applications in Industrial Processing II. pp.54-62, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5607

Conference Proceedings

6. Depth from (de)focus by local transform

Chalumeau, T. ; Meriaudeau, F. ; Laligant, O. ; Truchetet, F.

Pub. info.:	Wavelet Applications in Industrial Processing II. pp.46-53, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5607

Conference Proceedings

7. Denoising 3D models with attributes using soft thresholding

Roy, M. ; Foufou, S. ; Truchetet, F.

Pub. info.:	Wavelet Applications in Industrial Processing II. pp.139-147, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5607

Conference Proceedings

8. Gabor filters in industrial inspection: a review. Application to semiconductor industry [6001-08]

Meriaudeau, F. ; Truchetet, F. ; Laligant, O. ; Bourgeat, P.

Pub. info.:	Wavelet Applications in Industrial Processing III. pp.600108-600108, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6001

Conference Proceedings

9. Wavelets and edge localization in real images [6001-04]

Laligant, O. ; Truchetet, F. ; Meriaudeau, F.

Pub. info.:	Wavelet Applications in Industrial Processing III. pp.600104-600104, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6001

10.

Conference Proceedings

10. Lighting inhomogeneities removal by wavelet analysis [6383-28]

Laligant, O. ; Meriaudeau, F. ; Truchetet, F.

Pub. info.:	Wavelet Applications in Industrial Processing IV. pp.638304-638304, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6383

20 results

Select: Check all | Remove all

Sort order

10 | 50 | 100 / Per Page

Filtering by:

Author: Truchetet, F.