Spectral imaging : instrumentation, applications, and analysis : 25 January 2000, San Jose, California. pp.14-20, 2000. Bellingham. SPIE - The International Society for Optical Engineering
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Hard X-ray, gamma-ray, and neutron detector physics II : 31 July-2 August 2000, San Diego, USA. pp.194-199, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Advances in fluorescence sensing technology III : 9-11 February 1997, San Jose, California. pp.204-209, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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