1.

Conference Proceedings
Conference Proceedings
1. Geoautoclave-Type Zeolitization in the Miocene Tuffs, Meczek Mts., SW-Hungary
Polgari, M. ; Forizs, I. ; Toth, M. ; Pecsi-Donath, E. ; Mathe, Z.
Pub. info.: Zeolite science 1994 : recent progress and discussions : supplementary materials to the 10th International Zeolite Conference, Garmisch-Partenkirchen, Germany, July 17-22, 1994.  pp.34-,  1995.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 98
2.

Conference Proceedings
Conference Proceedings
2. Electron Beam Induced Impurity Electro-Migration in Unintentionally Doped GaN
Toth, M. ; Fleischer, K. ; Phillips, M. R.
Pub. info.: GaN and related alloys : symposium held November 30-December 4, 1998, Boston, Massachusetts, U.S.A..  pp.G3.30.1-,  1999.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 537
3.

Conference Proceedings
Conference Proceedings
3. Cathodoluminescence Microanalysis of Electron Irradiation Damage in Wide Bandgap Materials
Kalceff, M. A. Stevens ; Phillips, M. R. ; Toth, M. ; Moon, A. R. ; Jamieson, D. N. ; Orwa, J. O. ; Prawer, S.
Pub. info.: Microstructural processes in irradiated materials : symposium held November 30-December 2, 1998, Boston, Massachusetts, U.S.A..  pp.43-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 540
4.

Conference Proceedings
Conference Proceedings
4. Mechanical Properties of As-Grown and Ion-Beam-Modified GaN Films
Kucheyev, S.O. ; Bradby, J.E. ; Williams, J.S. ; Swain, M.V. ; Toth, M. ; Phillips, M.R. ; Jagadish, C.
Pub. info.: Fundamentals of nanoindentation and nanotribology II : symposium held November 28-30, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Penn..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 649
5.

Conference Proceedings
Conference Proceedings
5. Surface Disordering And Nitrogen Loss In GaN Under Ion Bombardment
Kucheyev, S.O. ; Williams, J.S. ; Jagadish, C. ; Zou, J. ; Toth, M. ; Phillips, M.R. ; Tan, H.H. ; Li, G. ; Pearton, S.J.
Pub. info.: Wide-bandgap electronic devices.  pp.T7.9-,  2001.  Warrendale, PA..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 622
6.

Conference Proceedings
Conference Proceedings
6. Self-regulating charge control for ultra high resolution scanning electron microscopy(Invited Paper)
Toth, M. ; Thiel, B. L. ; Knowles, W. R.
Pub. info.: Testing, Reliability, and Application of Micro- and Nano-Material Systems III.  pp.49-59,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5766