1.

Conference Proceedings
Conference Proceedings
1. Optical nonlinearity and holographic storage in azo side-chain liquid crystal polymer
Bao,X. ; Tian,Y. ; Tong,W.G.
Pub. info.: Organic photonic materials and devices II : 24-26 January 2000, San Jose, USA.  pp.105-111,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3939
2.

Conference Proceedings
Conference Proceedings
2. Optical fiber-based wave-mixing probe
Nunes,J.A. ; Mickadeit,F. ; Kemp,H. ; Tong,W.G.
Pub. info.: Advances in fluorescence sensing technology III : 9-11 February 1997, San Jose, California.  pp.429-433,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2980
3.

Conference Proceedings
Conference Proceedings
3. Sensitive capillary-based on-column detection method by laser wave mixing
Berniolles,S. ; Kan,H. ; Dai,L. ; Tong,W.G.
Pub. info.: Advances in fluorescence sensing technology III : 9-11 February 1997, San Jose, California.  pp.127-132,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2980
4.

Conference Proceedings
Conference Proceedings
4. Sensitive wave-mixing detectors for capillary electrophoresis and liquid chromatography
Kan,H. ; Berniolles,S. ; Nunes,J.A. ; Tong,W.G.
Pub. info.: Advanced technologies for environmental monitoring and remediation : 6-8 August 1996, Denver, Colorado.  pp.135-142,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2835
5.

Conference Proceedings
Conference Proceedings
5. Sensitive absorbance measurement for gas-phase analytes based on multiwave-mixing spectroscopy
Berniolles,S. ; Mickadeit,F. ; Maniaci,M.J. ; Tong,W.G.
Pub. info.: Advanced technologies for environmental monitoring and remediation : 6-8 August 1996, Denver, Colorado.  pp.248-254,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2835
6.

Conference Proceedings
Conference Proceedings
6. Excited-state optical storage study in a dye-doped film using four-wave mixing spectroscopy
Bao,X. ; Li,C. ; Kan,H. ; Dai,L. ; Tong,W.G.
Pub. info.: Photosensitive Optical Materials and Devices.  pp.343-347,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2998
7.

Conference Proceedings
Conference Proceedings
7. Sensitive on-column absorbance detection of native molecules
Berniolles,S. ; Kan,H. ; Dai,L. ; Knittle,J.E. ; Tong,W.G.
Pub. info.: Methods for Ultrasensitive Detection.  pp.200-206,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3270
8.

Conference Proceedings
Conference Proceedings
8. Sensitive sub-Doppler nonlinear spectroscopy for hyperfine-structure analysis using simple atomizers
Mickadeit,F.K. ; Kemp,H. ; Schafer,J. ; Tong,W.G.
Pub. info.: Methods for Ultrasensitive Detection.  pp.168-173,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3270
9.

Conference Proceedings
Conference Proceedings
9. Third-order nonlinearity and polarization holographic storage in acceptor-donor azo dye-doped PMMA films
Bao,X. ; Li,C. ; Tong,W.G.
Pub. info.: Third-Order Nonlinear Optical Materials.  pp.143-150,  1998.  Bellingham, Wash..  SPIE-The International Sosiety for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3473