1.

Conference Proceedings
Conference Proceedings
1. RELIABILITY OF OHMIC CONTACTS FOR AlGaAs/GaAs HBTs
Jackson, G. S. ; Tong, E. ; Saledas, P. ; Kazior, T. E. ; Sprague, R. ; Brooks, R. C. ; Hsieh, K. C.
Pub. info.: Advanced metallizations in microelectronics : symposium held April 16-20, 1990, San Francisco, California, U.S.A..  pp.289-294,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 181
2.

Conference Proceedings
Conference Proceedings
2. RELIABILITY OF OHMIC CONTACTS FOR AlGaAs/GaAs HBTs
Jackson, G. S. ; Tong, E. ; Saledas, P. ; Kazior, T. E. ; Sprague, R. ; Brooks, R. C. ; Hsieh, K. C.
Pub. info.: Degradation mechanisms in III-V compound semiconductor devices and structures : symposium held April 17-18, 1990, San Francisco, California, U.S.A..  pp.225-230,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 184
3.

Conference Proceedings
Conference Proceedings
3. Plastic packaging of VCSEL-based fiber optic transceivers for PCS fiber systems (Invited Paper)
Ho, F. ; Lui, B. ; Hung, V. ; Tong, E. ; Yau, K. ; Choi, T. ; Egnisaban, G. ; Mangente, T. ; Ng, S. ; Ng, A. ; Cheng, S. ; Cheung, E. ; Wipiejewski, T.
Pub. info.: Photonics Packaging and Integration V.  pp.104-116,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5731
4.

Conference Proceedings
Conference Proceedings
4. Active components for ultra-low-cost optical interconnects (Invited Paper)
Wipiejewski, T. ; Lui, B. ; Tong, E. ; Yau, K. ; Hung, V. ; Choi, T. ; Egnisaban, G. ; Mangente, T. ; Cheng, K. S. ; Ng, A. ; Cheung, E. ; Ng, S. ; Ho, F.
Pub. info.: Semiconductor and Organic Optoelectronic Materials and Devices.  pp.235-245,  2000.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5624