Design, process integration, and characterization for microelectronics : 6-7 March 2002, Santa Clara, USA. pp.46-53, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Design, process integration, and characterization for microelectronics : 6-7 March 2002, Santa Clara, USA. pp.61-71, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Design, process integration, and characterization for microelectronics : 6-7 March 2002, Santa Clara, USA. pp.180-194, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Karnowski, T.P. ; Tobin, K.W., Jr. ; Ferrell, R.K. ; Jatko, W.B. ; Lakhani, F.
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Design, process integration, and characterization for microelectronics : 6-7 March 2002, Santa Clara, USA. pp.120-127, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Sixth International Conference on Quality Control by Artificial Vision. pp.69-77, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Bourgeat, P.T. ; Meriaudeau, F. ; Tobin, K.W., Jr. ; Gorria, P.
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Sixth International Conference on Quality Control by Artificial Vision. pp.36-44, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Process and Materials Characterization and Diagnostics in IC Manufacturing. pp.115-126, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Price, J.R. ; Hylton, K.W. ; Tobin, K.W., Jr. ; Bingham, P.R. ; Hunn, J.D. ; Haines, J.R.
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Sixth International Conference on Quality Control by Artificial Vision. pp.476-484, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sixth International Conference on Quality Control by Artificial Vision. pp.209-219, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering