1.

Conference Proceedings

Conference Proceedings
Xiong,R. ; Li,Z. ; Yang,X. ; Tian,D. ; Shi,J. ; Tang,W.
Pub. info.: Fifth International Symposium on Optical Storage (ISOS 2000) : 22-26 May 2000, Shanghai, China.  pp.84-87,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4085
2.

Conference Proceedings

Conference Proceedings
Yang,D. ; Fan,R. ; Shen,Y. ; Tian,D. ; Li,L. ; Que,D.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.357-361,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4218
3.

Conference Proceedings

Conference Proceedings
Xiong,R. ; Tang,W. ; Shi,J. ; Tian,D.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.498-501,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
4.

Conference Proceedings

Conference Proceedings
Zhang,C. ; Jin,G. ; Feng,B. ; Tian,D.
Pub. info.: International Conference on Holography and Optical Information Processing (ICHOIP '96).  pp.62-64,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2866
5.

Conference Proceedings

Conference Proceedings
Yang,D. ; Lu,J. ; Shen,Y. ; Tian,D. ; Ma,X. ; Li,L. ; Que,D.
Pub. info.: International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals.  pp.116-119,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4412