1.

Conference Proceedings

Conference Proceedings
Yang,J. ; Tian,C. ; Xiao,Y.
Pub. info.: Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China.  pp.527-530,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4231
2.

Conference Proceedings

Conference Proceedings
Tian,C. ; Fan,J. ; Wang,W. ; Zhang,X. ; Yang,J.
Pub. info.: Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China.  pp.243-246,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4223
3.

Conference Proceedings

Conference Proceedings
Shen,B. ; Tian,C. ; Tang,M. ; Yang,Y. ; Cheng,J. ; Shen,L.
Pub. info.: Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China.  pp.31-38,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3558