1.

Conference Proceedings
Conference Proceedings
1. Superstructure of Bi2Sr2CaCu2O8 superconductors:a Raman scattering study
Loa,I. ; Hofmann,J. ; Litvinchuk,A.P. ; Thomsen,C. ; Zavaritsky,N.V.
Pub. info.: Spectroscopic Studies of Superconductors Part A : Infrared and Raman Spectra : 29 January - 1 February 1996, San Jose, California.  PartA  pp.248-252,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2696
2.

Conference Proceedings
Conference Proceedings
2. Theoretical and Experimental Study of the Lattice-Dynamical Properties of Cubic GaN
Stemer,H. ; Schewiola,A. ; Karch,K. ; Pavone,P. ; Strauch,D. ; Siegle,H. ; Kaczmarczyk,G. ; Filippidis,L. ; Thomsen,C.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.307-310,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
3.

Conference Proceedings
Conference Proceedings
3. Pressure-Dependent Dynamical and Dielectric Properties of GaN and AIN
Karch,K. ; Wagner,J.-M. ; Siegle,H. ; Thomsen,C. ; Bechstedt,F.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.303-306,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
4.

Conference Proceedings
Conference Proceedings
4. Crystal-field transitions of Nd3+ and Er3+ in Perovskite-type crystals
Dietrich,M. ; Thurian,P. ; Loa,I. ; Gronemeyer,S. ; Litvinchuk,A.P. ; Thomsen,C.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1589-1594,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
5.

Conference Proceedings
Conference Proceedings
5. Raman scattering from defects in GaN
Siegie,H. ; Kaschner,A. ; Loa,I. ; Thurian,P. ; Hoffmann,A. ; Broser,I. ; Thomsen,C.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1197-1202,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
6.

Conference Proceedings
Conference Proceedings
6. Zeeman study of the 0.94 eV emission in AlN and GaN
Thurian,P. ; Loa,I. ; Maxim,P. ; Pressel,K. ; Hoffmann,A. ; Thomsen,C.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1131-1136,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263