1.

Conference Proceedings
Conference Proceedings
1. *IN-SITU STRAIN MEASUREMENT VIA X-RAY DIFFRACTION
Thompson, R.D. ; Angilello, J.
Pub. info.: Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A..  pp.291-302,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 208
2.

Conference Proceedings
Conference Proceedings
2. GROWTH AND CHARACTERIZATION OF EPITAXIAL CoSi2 ON Si (001)
Jimenez, J.R. ; Hsiung, L.M. ; Thompson, R.D. ; Hashimoto, Shin ; Ramanathan, K.V. ; Arndt, R. ; Rajan, K. ; Iyer, S.S. ; Schowalter, L.J.
Pub. info.: Layered structures : heteroepitaxy, superlattices, strain, and metastability : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.237-242,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 160