1.

Conference Proceedings
Conference Proceedings
1. Low-cost moderate-resolution spectrometer without grating
Bankman, J. R. ; Rogala, E. W. ; Thomas, M. E.
Pub. info.: Unattended/unmanned ground, ocean, and air sensor technologies and applications VI : 12-15 April 2004 Orland, USA.  pp.132-138,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5417
2.

Conference Proceedings
Conference Proceedings
2. SELECTIVE ELECTROLESS METALLIZATION OF PATTERED LIGAND SURFACES
Dressick, W. J. ; Dulcey, C. S. ; Calvert, J. M. ; Georger Jr., J. H. ; Calabrese, G. S. ; Thomas, M. E. ; Stever, H. A.
Pub. info.: Advanced metallization and processing for semiconductor devices and circuits--II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A..  pp.659-664,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 260
3.

Conference Proceedings
Conference Proceedings
3. Electroplated Cu Recrystallization in Damascene Structures at Elevated Temperatures
Jiang, Q-T. ; Thomas, M. E. ; Bersuker, G. ; Foran, B. ; Mikkola, R. ; Carpenter, B. ; Ormando, J.
Pub. info.: Advanced interconnects and contacts : symposium held April 5-7, 1999, San Francisco, California, U.S.A..  pp.429-,  1999.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 564
4.

Conference Proceedings
Conference Proceedings
4. Comparison between Adachi and Lorentzian models of semiconductor materials for FDTD implementation of femtosecond pulse propagation
Matsumoto, S. A. ; Joseph, R. I. ; Sova, R. M. ; Thomas, M. E.
Pub. info.: Solid state laser technologies and femtosecond phenomena : 25-27 October, 2004, London, United Kingdom.  pp.228-238,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5620
5.

Conference Proceedings
Conference Proceedings
5. Physics-based polarimetric BRDF models
Duncan, D. D. ; Hahn, D. V. ; Thomas, M. E.
Pub. info.: Optical diagnostic methods for inorganic materials III : 6-7 August 2003, San Diego, California, USA.  pp.129-140,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5192
6.

Conference Proceedings
Conference Proceedings
6. Analysis and representation of BSDF and BRDF measurements
Thomas, M. E. ; Blodgett, D. W. ; Hahn, D. V.
Pub. info.: Optical diagnostic methods for inorganic materials III : 6-7 August 2003, San Diego, California, USA.  pp.158-167,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5192
7.

Conference Proceedings
Conference Proceedings
7. Optical characterization of AION and spinel
Blodgett, D. W. ; Hahn, D. V. ; Thomas, M. E.
Pub. info.: Window and dome technologies and materials IX : 28-29 March 2005, Orlando, Florida, USA.  pp.83-94,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5786
8.

Conference Proceedings
Conference Proceedings
8. Spectral refractive index and extinction cross-section of BG spores
Airola, M. B. ; Boggs, N. T. ; Jackman, J. ; Fainchtein, R. ; Carter, C. C. ; Thomas, M. E.
Pub. info.: Chemical and biological sensing VI : 28-29 March 2005, Orlando, Florida, USA.  pp.134-141,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5795
9.

Conference Proceedings
Conference Proceedings
9. THE EFFECT OF OXYGEN IN COSPUTTERED (TITANIUM + SILICON ) FILMS
Beyers, R. ; Sinclair, R. ; Thomas, M. E.
Pub. info.: Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A..  pp.423-428,  1983.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 14
10.

Conference Proceedings
Conference Proceedings
10. TEM studies of cosputtered TiSi2 films containing excess silicon
Beyers, R. ; Sinclair, R. ; Thomas, M. E.
Pub. info.: Thin films and interfaces II : symposium held November 1983, in Boston, Massachusetts, U.S.A..  pp.601-606,  1984.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 25