1.

Conference Proceedings
Conference Proceedings
1. Measurements with the Chandra X-Ray Observatory's flight contamination monitor
Elsner,R.F. ; Kolodziejczak,J.J. ; O'Dell,S.L. ; Swartz,D.A. ; Tennant,A.F. ; Weisskopf,M.C.
Pub. info.: X-ray optics, instruments, and missions IV : 30-31 July 2000, San Diego, USA.  pp.1-9,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4138
2.

Conference Proceedings
Conference Proceedings
2. Spectral fitting in AXAF calibration detectors
Edgar,R.J. ; Tsiang,E.Y. ; Tennant,A.F. ; Vitek,S.A. ; Swartz,D.A.
Pub. info.: Grazing incidence and multilayer X-ray optical systems : 27-29 July 1997, San Diego, California.  pp.124-131,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3113
3.

Conference Proceedings
Conference Proceedings
3. Uses of continuum radiation in the AXAF calibration
Kolodziejczak,J.J. ; Austin,R.A. ; Elsner,R.F. ; O'Dell,S.L. ; Sulkanen,M.E. ; Swartz,D.A. ; Tennant,A.F. ; Weisskopf,M.C. ; Zirnstein,G. ; McDermott,W.C.
Pub. info.: Grazing incidence and multilayer X-ray optical systems : 27-29 July 1997, San Diego, California.  pp.65-76,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3113
4.

Conference Proceedings
Conference Proceedings
4. JMKMOD: a software suite within XSPEC for the ground calibration of AXAF
Tsing E.Y. ; Edgar,R.J. ; Vitek,S.A. ; Tennant,A.F.
Pub. info.: Grazing incidence and multilayer X-ray optical systems : 27-29 July 1997, San Diego, California.  pp.132-141,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3113
5.

Conference Proceedings
Conference Proceedings
5. Measurements with the Chandra X-ray Observatory's flight contamination monitor
Elsner,R.F. ; Kolodziejczak,J.J. ; O'Dell,S.L. ; Swartz,D.A. ; Tennant,A.F. ; Weisskopf,M.C.
Pub. info.: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.612-618,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4012
6.

Conference Proceedings
Conference Proceedings
6. Modeling the Chandra space environment
Jr.,W.C.Blackwell ; Minow,J.I. ; O'Dell,S.L. ; Suggs,R.M. ; Swartz,D.A. ; Tennant,A.F. ; Virani,S.N. ; Warren,K.M.
Pub. info.: X-ray, and gamma-ray instrumentation for astronomy XI : 2-4 August 2000 San Diego, USA.  pp.111-122,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4140
7.

Conference Proceedings
Conference Proceedings
7. Radiation environment of the Chandra X-Ray Observatory
O'Dell,S.L. ; Bautz,M.W. ; Jr.,W.C.Blackwell ; Butt,Y.M. ; Cameron,R.A. ; Elsner,R.F. ; Gussenhoven,M.S. ; Kolodziejczak,J.J. ; Minow,J.I. ; Suggs,R.M. ; Swartz,D.A. ; Tennant,A.F. ; Virani,S.N. ; Warren,K.M.
Pub. info.: X-ray, and gamma-ray instrumentation for astronomy XI : 2-4 August 2000 San Diego, USA.  pp.99-110,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4140
8.

Conference Proceedings
Conference Proceedings
8. AXAF HXDS germanium solid state detectors
McDermott,W.C. ; Kellogg,E.M. ; Wargelin,B.J. ; Evans,I.N. ; Vitek,S.A. ; Tsiang,E.Y. ; Schwartz,D.A. ; Edgar,R.J. ; Kraft,S. ; Scholze,F. ; Thornagel,R. ; Ulm,G. ; Weisskopf,M.C. ; O'Dell,S.L. ; Tennant,A.F. ; Kolodziejczak,J.J. ; Zirnstein,G.
Pub. info.: Grazing incidence and multilayer X-ray optical systems : 27-29 July 1997, San Diego, California.  pp.535-543,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3113
9.

Conference Proceedings
Conference Proceedings
9. Absolute calibration of the AXAF telescope effective area
Kellogg,E.M. ; Cohen,L.M. ; Edgar,R.J. ; Evans,I.N. ; Freeman,M.D. ; Gaetz,T.J. ; Jerius,D. ; McDermott,W.C. ; McKinnon,P.J. ; Murray,S.S. ; Podgorski,W.A. ; Schwartz,D.A. ; Van Speybroeck,L.P. ; Wargelin,B.J. ; Zombeck,M.V. ; Weisskopf,M.C. ; Elsner,R.F. ; O'Dell,S.L. ; Tennant,A.F. ; Kolodziejczak,J.J.
Pub. info.: Grazing incidence and multilayer X-ray optical systems : 27-29 July 1997, San Diego, California.  pp.515-525,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3113