1.

Conference Proceedings
Conference Proceedings
1. Hot Electron Induced Impact Ionization and Light Emission in GaAs based MESFET's, HEMT's, RM-HEMT's, and HBT's
Canali C. ; Tedesco C. ; Zanoni E. ; Manfredi M. ; Paccagnella A.
Pub. info.: Negative differential resistance and instabilities in 2-D semiconductors.  pp.251-260,  1993.  New York.  Plenum Press
Title of ser.: NATO ASI series. Series B, Physics
Ser. no.: 307
2.

Conference Proceedings
Conference Proceedings
2. Failure Mechanisms of GaAs MESFETs and Low-Noise HEMTs
Magistrali F. ; Tedesco C. ; Zanoni E.
Pub. info.: Semiconductor device reliability.  pp.211-267,  1990.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO ASI series. Series E, Applied sciences
Ser. no.: 175